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Contact Information

Email: boat.soe@knust.edu.gh

           koboat2000@gmail.com

 

Educational History

  1. [1997 to 2000] Graduate School of Science and Engineering, Ehime University, Matsuyama (DE in Systems Engineering).
  2. [1995-1997] Graduate School of Science and Engineering, Ehime University, Matsuyama (ME in Computer Science).
  3. [1994-1995] Japanese Language Center, Hiroshima University (Japanese language study)
  4. [1987-1991] School Of Engineering, University Of Science and Technology, Kumasi, (BSc. in Electrical/Electronic Engineering).

 

Some Courses I Teach

  1. Applied Electronics
  2. Basic Electronics
  3. Object Oriented Programming
  4. Digital computer design
  5. Microprocessors
  6. Operating systems
  7. Computer networking
  8. Distributed computing
  9. Secure network systems
  10. Computer graphics
  11. Artificial intelligence
  12. Robotics & computer vision
  13. Fault diagnosis and failure tolerance
  14. Computer architecture

 

Research Interests

  1. Design, test and diagnosis of logic and VLSI circuits
  2. Test of PLL
  3. Network security and energy efficiency
  4. Sensor Networks
  5. Applications of residual number systems (RNS)
  6. Image processing and smart metering

 

Areas of Expertise 

  1. Networking
  2. Embedded systems
  3. Microprocessors and microprocessor-based design
  4. VLSI test engineering
  5. Energy Source and Demand Management
  6. Energy Data Management
  7. Smart Metering
  8. Computer Networking
  9. Curriculum Development

 

Achievements and Awards

  1. Reviewer, 10th IEEE Asian Test Symposium (ATS’01)
  2. Reviewer, IEEE VLSI Test Symposium (VTS’02)
  3. Program Committee Member, 11th IEEE Asian Test Symposium (ATS’02)
  4. Tutor, ICTP Microprocessor Laboratory African Regional Course on Advanced VLSI Design Techniques, Ghana, 2003
  5. Tutor, ICTP-KNUST Microelectronics Workshop on FPGA and VHDL for Research and Training in African, Ghana, 2005
  6. Chair, Local Organizing Committee for IEEE ICAST November, 2012
  7. ICT consultant to Kwame Nkrumah University of Science and Technology, Kumasi, Ghana
  8. Head of Department of Computer Engineering, KNUST, 2003-2009, 2011-2015
  9. Top CCNA Exploration Instructor Award, Cisco Networking Academy, West & Central Africa (English), 2013
  10. Encouragement Award (Shikoku-sections of The Institutes of Electrical and Related Engineers (Ehime University, Japan, 1997)
  11. Charles Deakins Award (U.S.T., Ghana, 1991)
  12. Keynote Address: Sustainable ICT Development—what it is not. 3rd Meeting of the EuroAfrica-ICT Group, Brussels. September 27, 2007.
  13. NATIONAL ENERGY DATA PROCESSING AND INFORMATION CENTRE (NEDPIC)–design and implementation of database
  14. ICT on KNUST Campus

 

 Professional Membership

  1. Member, IEEE
  2. Member, IEEE Computer Society

 

Publications

Journals

  1. Nunoo-Mensah, H., Boateng, K. O., and Gadze, J., “Tamper-aware authentication framework for wireless sensor networks,” IET Wireless Sensor Systems, January 2017.
  2. Sekyere, Y. O. M., and Boateng, K. O. (2015): Improving Power Line Communication For Cost Effective Smart Metering Application, Journal of Multidisciplinary Engineering Science and Technology (JMEST), Vol. 2 Issue 7, pp. 1627-1634, July.
  3. Keelson, E., Boateng, K. O., and Ghansah, I. (2015): Low Cost Early Adoption Procedures for Implementing Smart Prepaid Metering Systems in African Developing Countries, Journal of Multidisciplinary Engineering Science and Technology (JMEST), Vol. 2 Issue 2, pp. 240-250, February.
  4. Asiedu, W and Boateng, K. O., (2015): Reliable and Rapid Routing Configurations for Network Recovery, International Journal of Science and Research (IJSR), Vol. 4 Issue 2, pp. 2448-2452, Februaury.
  5. Nunoo-Mensah, H., Boateng, K. O., and Gadze, J. D., (2015): Comparative Analysis of Energy Usage of Hash Functions in Secured Wireless Sensor Networks, International Journal of Computer Applications, Vol. 109, No. 11, pp. 20-23, January.
  6. Nunoo-Mensah, H., Akowuah, E. K. and Boateng, K. O., (2014): Review of Opensource Network Access Control (NAC) Tools for Enterprise Educational Networks, International Journal of Computer Applications, Vol. 106, No. 6, pp. 28-33, November.
  7. Keelson, E., Boateng, K. O., and Ghansah, I. (2014): A Smart Retrofitted Meter for Developing Countries, International Journal of Computer Applications, Vol. 90, No. 5, pp. 40-46, March.
  8. Bonsu, K. A., Boateng, K. O., Oppong, J. K. and Dotche, K. A. (2013): Small-Scale Fading Characteristics in Cellular Networks in Ghana, International Journal of Interdisciplinary Telecommunications and Networking, 5(3), pp. 23-33, July-September.
  9. Weyori B. A. and Boateng, K. O. (2013): Dynamic Intelligent Mean Filter for Impulse Noise Suppression in 2D Images, International Journal of Modern Engineering, Vol. 13, No. 2, Spring/Summer.
  10. Asiedu, W., Boateng, K. O. and Rajan, J. (2012): Server-Aided Public Key Signatures for Diverse Network Devices, International Journal of Technology & Management Research (IJTMR), Vol.1, No.1, pp. 57-63, July 2012.
  11. Boateng, K. O. and Baagyere, E. Y. (2012): A Smith-Waterman Algorithm Accelerator Based on Residue Number System. International Journal of Electronics and Communication Engineering, ISSN 0974-2166 Volume 5, Number 1 (2012), pp. 99-112
  12. Boateng, K. O. and Weyori, B. A. (2012): Improving the Effectiveness of the Median Filter. International Journal of Electronics and Communication Engineering, ISSN 0974-2166 Volume 5, Number 1 (2012), pp. 85-97
  13. Boateng, K. O. and Opare, K. A-B. (2011): Reducing Test Application Time through Test Sub-Pattern Re-use, Journal of Electrical Engineering, ISSN 1582-4594, Vol.11, No.1, pp. 65-74. : www.jee.ro )
  14. Boateng, K. O. (2009); Static Test Compaction as a Minimum Covering Problem, Journal of Science and Technology, Vol.29 No.3, pp.126-135, 2009
  15. Osei-Dadzie G. and Boateng, K. O. (2009): Application of Block-Based Approach in Design of a Reconfigurable Virtual Instrumentation Platform, Vol.11, Issue 1, International Journal of Agile Manufacturing (IJAM), 2009
  16. Boateng, K. O. (2007): A New Defect-Oriented Method for Testing the PLL, Journal of Engineering and Technology, Vol.1, pp.37-42, Sept. 2007
  17. Boateng, K. O. (2004): Automatic Test Pattern Generation for Iterative Logic Arrays, Journal of Science and Technology, Vol.24 No.2, pp.1-7, 2004
  18. Takahashi, H., Boateng, K. O., Saluja, K. K., and Takamatsu Y. (2002): “On diagnosing multiple stuck-at faults using multiple and single fault simulation in combinational circuits,” IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems , vol. 21, pp. 362-368, March 2002
  19. Takahashi, D. Kadoguchi, K. O. Boateng, Y. Takamatsu, and K. K. Saluja (2001): “Design error diagnosis using backward path-tracing and logic simulation,” International Technical Conference on Circuits/System, Computers and Communications (ITC-CSCC 01) , pp.~426–429, July
  20. Boateng, K. O., Takahashi, H. and Takamatsu, Y. (2000): “Design of C-Testable Modified-Booth Multipliers,” IEICE TRANS. INF. & SYST., Vol.E83-D, No.10, pp.1868–1878, October 2000
  21. Boateng, K. O., Takahashi, H. and Takamatsu, Y. (1999): “Diagnosing Delay Faults in Combinational Circuits Under the Ambiguous Delay Model,” IEICE TRANS. INF. & SYST., Vol.E82-D, No.12, pp. 1563—1571, Dec. 1999.
  22. Takahashi, H., Boateng, K. O. and Takamatsu, Y. (1999): “A Method of Generating Tests with Linearity Property for Gate Delay Faults in Combinational Circuits,” IEICE TRANS. INF. & SYST., Vol.E82-D, No.11, pp.1466—1473, Nov.1999.
  23. Takahashi, H., Boateng, K. O. and Takamatsu, Y. (1999): “A Method for Diagnosing Single Gate Delay Faults Using Delay Fault Simulation,” IEICE TRANS. INF. & SYST., Vol. J82-D-I (in Japanese), No.7, pp.925—932, July 1999.
  24. Boateng, K. O., Takahashi, H. and Takamatsu, Y. (1998): “Multiple Gate Delay Fault Diagnosis Using Test-Pairs for Marginal Delays,” IEICE TRANS. INF. & SYST., E81-D, No.7, pp.706—715, July 1998.

 

Publications in Proceedings of International Conferences

  1. Azasoo, J. Q. and Boateng, K. O. (2015): A Retrofit Design Science Methodology for Smart Metering Design in Developing Countries, Proceedings, 15th International Conference on Computational Science and its Applications (ICCSA 2015), pp.1-7, June 22-25, Banff, AB, Canada.
  2. Oduro-Gyimah, F. K., Azasoo, J, Q. and Boateng, K. O. (2013): Statistical Analysis of Outage Time of Commercial Telecommunication Networks in Ghana, Proceedings, International Conference on Adaptive Science and Technology (ICAST 2013), pp.1-8, November 25-27.
  3. Bonsu, K. A., Boateng, K. O., Oppong, J. K. and Dotche, K. A. (2013): Small-Scale Fading Characteristics in Cellular Networks in Ghana, Proceedings, Wireless Telecommunication Symposium (WTS 2013), Phoenix, Arizona, USA, April 17-19.
  4. Azasoo, J. Q. and Boateng, K. O. (2012): Smart Metering: A GSM Approach in Ghana, Proceedings, International Conference on Adaptive Science and Technology (ICAST 2012), pp.158-163.
  5. Asiedu, W., and Boateng, K. O. (2012): Assisting Network Contrivances with Public Key Signatures, Proceedings, International Conference on Adaptive Science and Technology (ICAST 2012), pp.164-168.
  6. Baagyere, E. Y., Boateng, K. O., and Gbolagade K. A. (2009): Bioinformatics: An Important Application Area of Residue Number System, International Conference on Mathematics and its Applications, Accra, June 16 – 20 2009
  7. Weyori, B. A., Boateng, K. O., and Gbolagade K. A. (2009): Residue Number System: An important tool to Secured Digital Image Coding, International Conference on Mathematics and its Applications, Accra, June 16 – 20 2009
  8. Osei-Dadzie, G. and Boateng, K. O. (2008): Application of Block-Based Design Methodology in Reconfigurable Virtual Instrumentation, 2008 IAJC/IJME/NAIT International Conference, Nashville, USA, Nov. 17 – 19 2008
  9. Hiraide,, Boateng, K. O., Konishi, H., Itaya, K., Emori, M., Yamanaka, H., Mochiyama, T. (2003): BIST-Aided Scan Test – A New Method for Test Cost Reduction, Proc. 21st IEEE VLSI Test Symposium, pp.359—364, April 27 – May 01, 2003
  10. Boateng, K. O., Konishi, H. and Nakata, T. (2001): “A Method of Static Compaction of Test Stimuli”, Proc. IEEE 10th Asian Test Symposium, pp.137—142, November, 2001.
  11. Takahashi, H., Kadoguchi, D., Boateng, K. O., Takamatsu, Y. and Saluja, K. K. (2001): “Design error diagnosis using backward path-tracing and logic simulation,” International Technical Conference on Circuits/System, Computers and Communications (ITC-CSCC 01), pp.~426–429, July 2001
  12. Boateng, K. O., Takahashi, H. and Takamatsu, Y. (2000): “A General BIST-Amenable Method of Test Generation for Iterative Logic Arrays,” Proc. 18th IEEE VLSI Test Symposium, pp.171—176, April 2000.
  13. Takahashi, H., Boateng, K. O., Yanagida, N. and Takamatsu, Y. (1999): “Multiple Fault Diagnosis in Logic Circuits using EB Tester and Multiple/Single Fault Simulators,” Proc. IEEE Eighth Asian Test Symposium, pp.341—346, 1999.
  14. Takahashi, H., Boateng, K. O. and Takamatsu, Y. (1999): “A New Method for Diagnosing Multiple Stuck-at Faults using Multiple and Single Fault Simulations,” Proc. IEEE VLSI Test Symposium, pp.64—69, April 1999.
  15. Takahashi, H., Boateng, K. O. and Takamatsu, Y. (1998): “Diagnosis of Single Gate Delay Faults in Combinational Circuits using Delay Fault Simulation,” Proc. IEEE Seventh Asian Test Symposium, pp.108—112, December 1998.
  16. Takahashi, H., Matsunaga, T., Boateng, K. O. and Takamatsu, Y. (1997): “A Method of Generating Tests for Marginal Delays and Delay Faults in Combinational Circuits,” Proc. IEEE Sixth Asian Test Symposium, pp.320—325, Nov. 1997.
  17. Boateng, K. O., Takahashi, H. and Takamatsu, Y. (1997): “Design of C-Testable Multipliers Based on the Modified Booth Algorithm,” Proc. IEEE Sixth Asian Test Symposium, pp.42—47, Nov. 1997.

 

Technical Reports

  1. Boateng, K. O., Konishi, H. and Nakata, T. (2001): “A Method of Test Pattern Compaction”, Record of DA Symposium, July 2001.
  2. Boateng, K. O., Takahashi, H. and Takamatsu, Y. (1999): “Design of C-Testable Modified-Booth Multipliers Under the Stuck-at Fault Model,” Memoirs of the Faculty of Engineering, Ehime University, Vol. XVIII, pp.425—435, Feb. 1999.
  3. Boateng, K. O., Takahashi, H. and Takamatsu, Y. (1999): “A Method of Test Generation for Iterative Logic Arrays,” Technical Report of IEICE, Vol. 99, No.4, ICD99-13, CPSY99-13, FTS99-13, pp.53—60, April 1999.
  4. Takahashi, H., Boateng, K. O. and Takamatsu, Y. (1999): “A Method for Diagnosing Multiple Stuck-at Faults in Combinational Circuits using Single and Multiple Fault Simulations,” Technical Report of IEICE, FTS98-127, pp.31—38, Feb. 1999.
  5. Boateng, K. O., Takahashi, H. and Takamatsu, Y. (1998): “A Method of Diagnosing Delay Faults in Combinational Circuits Under the Ambiguous Delay Model,” Record of LSI Testing Symposium, pp.69—74, Nov. 1998.
  6. Boateng, K. O., Takahashi, H. and Takamatsu, Y. (1997): “C-Testable Design of Multipliers Based on the Modified Booth Algorithm,” Technical Report of IEICE, VLD96-87, ICD96-197, PP.1—8, Mar. 1997.
  7. Matsunaga, T., Boateng, K. O., Yanagida, N., Takahashi, H., Takamatsu, Y. (1997): “Generation of Sensitizing Input-pairs Having Multiple-Input Change,” Technical Report of IEICE, FTS96-70, pp.97—104, Feb. 1997.

Convention Records, etc.

  1. Boateng, K. O., Takahashi, H. and Takamatsu, Y. (1998): “Delay Fault Diagnosis Under the Ambiguous Delay Model,” Joint Convention Record of the Shikoku-Section of The Institute of Electrical and Related Engineers Japan, pp.146, 1998.
  2. Boateng, K. O., Takahashi, H. and Takamatsu, Y. (1998): “A Method of Multiple Stuck-at Fault Diagnosis using Multiple and Single Fault Simulations,” Joint Convention Record of the Shikoku-Section of The Institute of Electrical and Related Engineers Japan, pp.147, 1998.
  3. Takahashi, H., Boateng, K. O. and Takamatsu, Y. (1997): “A Method of Gate Delay Diagnosis using Delay Fault Simulation,” Joint Convention Record of the Shikoku-Section of The Institute of Electrical and Related Engineers Japan, pp.126, 1997.
  4. Boateng, K. O., Takahashi, H. and Takamatsu, Y. (1996): “A Method of Diagnosing Multiple Delay Faults in Combinational Circuits using Tests for Small Delay Faults,” Joint Convention Record of the Shikoku-Section of The Institute of Electrical and Related Engineers Japan, pp.122, 1996.

Oral Presentations

International Conferences

  1. Application of Block-Based Design Methodology in Reconfigurable Virtual Instrumentation, 2008 IJME/NAIT International Conference, Nov. 2008
  2. A Method of Static Compaction of Test Stimuli, 10th IEEE Asian Test Symposium, Nov. 2001.
  3. Design of C-Testable Multipliers Based on the Modified Booth Algorithm, Sixth IEEE Asian Test Symposium, Nov. 1997.

IEICE and Other Workshops (Japan)

  1. A Method of Test Pattern Compaction, Record of DA Symposium, July 2001.
  2. A Method of Test Generation for Iterative Logic Arrays, ICD/CPSY/FTS Workshop, April 1999.
  3. C-Testable Design of Multipliers Based on the Modified Booth Algorithm, VLD/ICD Workshop, Mar. 1997.
  4. A Method of Diagnosing Delay Faults in Combinational Circuits Under the Ambiguous Delay Model, LSI Testing Symposium, May/June 1998.

Workshops of the Research Group on Fault Tolerant-Computing, Japan

  1. Boateng, K. O., Takahashi, H. and Takamatsu, Y. (1999): Test Generation for Iterative Logic Arrays, 41st FTC Workshop, July 1999.
  2. Boateng, K. O., Takahashi, H. and Takamatsu, Y. (1997): Multiple Delay Fault Diagnosis in Combinational Circuits using Tests for Small Delay Faults,’ 36th FTC Workshop, Jan. 1997.

Conventions of the Institute of Electrical and Related Engineers (Japan) and others

  1. A Method of Test Pattern Compaction, DA Symposium, July 2001.
  2. Delay Fault Diagnosis Under the Ambiguous Delay Model, The Institute of Electrical and Related Engineers, Joint Convention of the Shikoku-Section, 1998.
  3. A Method of Diagnosing Multiple Delay Faults in Combinational Circuits using Tests for Small Delay Faults, The Institute of Electrical and Related Engineers (Japan), Joint Convention of the Shikoku-Section, 1996.

Keynote Address

  1. Boateng, K. O., (2007). Sustainable ICT Development—what it is not. 3rd Meeting of the EuroAfrica-ICT Group, Brussels. September 27, 2007. [euroafrica-ict.org.sigma-orionis.com/events/concertation_meeting_3.php (November 12, 2010)]

Patents

  1. Boateng, K. O. (2007): Apparatus and Method for Test-Stimuli Compaction, Patent No. US 7,260,793 B2, August 21.
  2. Boateng, K. O. (2003): Device and Method for Testing Phase-Locked Loops, Patent No. US 6,642,701 B2, November 4.

 

Biographical References

  1. 18th edition (first of the 21st century editions) of Marquis “Who’s Who In The World” (pp.232).
  2. International Biographical Centre’s First Edition of “2000 Outstanding Scientists of the 21st Century”.
  3. 6th edition of Marquis “Who’s Who in Science and Engineering 2002-2003” (pp.94).